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M² Measurement System


This advanced M² Measurement System, featuring a compact, all-in-one design integrated with a high-precision motorized translation stage and a high-resolution beam profiler for capturing beam profiles. The system utilizes independently developed analysis software to accurately measure critical beam quality parameters, including: M² factor, beam divergence angle, focus diameter, beam waist position, Rayleigh length, and other essential characteristics.
Engineered to achieve an overall accuracy within ±5%, the system meets rigorous demands for beam quality analysis. It is widely applicable in laser technology, fiber-optic communications, biomedical research, and laser-based manufacturing. With short lead times, responsive after-sales support, and high cost-effectiveness, it is an economical and efficient alternative to imported beam quality analyzers.

 

 

Application

  • Manufacturing
  • Scientific Research
  • Defense & Aerospace
  • Medical & Life Sciences

Performance Advantages

  • Capable of measuring the quality of continuous and pulsed laser beams
  • Spectral detection range 340-1100nm
  • Detection accuracy 5%
  • Easy to operate, fast one click measurement

Specification

ModelCN0310VIS-M2-B

Operating Wavelength

  340-1100 nm

M² Measurement Range 

  1 -50

Max Input Spot Size 

  ≤5 mm @ 355 nm (1/e²)
  ≤7.5 mm @ 532 nm (1/e²)
  ≤10 mm @ 1064 nm (1/e²)

Measurement Accuracy

  ≤5%

Focus Position Accuracy

   ±10%

Pixel Size

  3.2 μm

Max Resolution 

  2448 × 2448 pixels

Laser Power Handling 

  CW: 1 μW – 10 W/cm²
  Pulsed: 10 μJ – 10 mJ/cm²

Bit Depth

  12-bit

Attenuator

  OD0.5 / OD1 / OD1.5 / OD2 / OD3 / OD4

Interface 

  USB 3.0

Scanning Range

  200 mm travel (Double optical path length)

Repositioning Accuracy

  ±5 μm

Controller

  RS232 interface, dual-axis motorized stage

Weight 

  <15 kg

Dimensions 

  500 × 250 × 175 mm (reference design)

DatasheetDownload

 

Operating software