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(Ultra) Low-Noise Test System
The SLFN-2000 is a highly cost-effective test system integrating low-frequency noise measurement, ultra-low-frequency noise measurement, IV scanning, and transient response measurement. It features a compact structure incorporating a micro-optical platform, low-noise current amplifier, spectrum analyzer, and optical microscope. Core modules utilize imported precision components to ensure exceptional measurement accuracy, achieving a noise floor as low as 10-28A2/Hz. Supporting both two-terminal and three-terminal testing, this system fulfills diverse testing requirements.
Currently, the SLFN-2000 (Ultra)Low-Frequency Noise Test System has been successfully deployed at multiple scientific institutions including: Changchun Institute of Applied Chemistry、Changchun University of Science and Technology、Nanjing University、Jiangnan University、Henan Normal University、Southwest University、Xiamen University.
Features
| Application
|
Model | SLFN-2000 |
Bias Voltage Range | ±10 |
Current Resolution | <500 fA or <1 fA |
Frequency Range | 0.1 Hz - 100 kHz or 0.01 Hz - 10 Hz |
Signal Output Range | 0.2 V, 1 V, 5 V, 10 V |
Current Amplification Factor | 103 -10 11 or 10 5 -10 13 |
System Noise Floor | 10 -28 A 2 /Hz (low frequency) or 10 -32 A 2 /Hz (Ultra-low frequency) |
Data Averaging Mode | RMS, Vector, Peak |
Datasheet |
|
Interface
Product measurement data display
 |  |
I-V Curve Scanning | Photocurrent, dark current |
 |  |
Low frequency 1/f noise | Ultra-low frequency 1/f noise |
Changchun New Industries Optoelectronics Technology Co., Ltd.
Address: No. 888 Jinhu Road, High-Tech Zone, Changchun, 130103, P.R.China
International Tel:+86-431-85603799
Email: sales@cnilaser.com
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