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Z-Scan Technology: STA-ZSS
Z-scan technology was proposed and analyzed by Bahae in 1989. Traditional degenerate four-wave mixing methods struggle to distinguish between nonlinear refraction and nonlinear absorption, as well as to determine whether the nonlinear refractive index is positive or negative. In contrast, the Z-scan method overcomes these challenges entirely, making it an increasingly simple and popular experimental technique for characterizing optical materials. In this method, the sample is translated along the axis of a focused Gaussian beam, while the far-field intensity is measured as a function of the sample’s position. The experimental setup is straightforward, offering high measurement sensitivity and enabling the determination of both the magnitude and sign of the nonlinear refractive index, as well as the nonlinear absorption coefficient.
Experimental setup
Features
- The spectral response range is 0.19–15 µm. The optoelectronic detector
- 532nm Continuous Wave DPSS Laser
- User-friendly, efficient, and convenient software interface
- Highly flexible free-space optical path
- Real-time image scanning and rendering
Experimental Case
In the SPSI measurement system, light reflected from the object is modulated by a Digital Micromirror Device (DMD), passed through the entrance slit of a spectrometer, then measured by a spectral imaging device, and finally detected by a linear-array CCD detector.
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Z-Scan Schematic | Z-scan Curve |
Changchun New Industries Optoelectronics Technology Co., Ltd.
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