Leave a message for inquiry
Leave your phone number, and we'll get in touch with you as soon as possible.
STA-LFNT (Ultra) Low-frequency Noise Test System
Its functions include low-frequency noise testing, (ultra-)low-frequency noise testing, and RTN (Random Telegraph Noise) testing and characterization. By measuring data such as 1/f noise and noise power spectra, the system directly reveals internal lattice defects, interface charge traps, and carrier transport behaviors within the device, providing experimental evidence for material composition optimization, device structure design, and process improvement.
The system integrates a miniature optical platform, a low-noise current amplifier, a spectrum analyzer, and an optical microscope. Its core modules are sourced from imported brands to ensure measurement accuracy.
To date, the STA-LFNT (Ultra-)Low-Frequency Noise Test System has been adopted by numerous research institutions and universities, including Tsinghua University, Nanjing University, Harbin Institute of Technology, Dalian University of Technology, Changchun Institute of Applied Chemistry (CIAC), Changchun University of Science and Technology, Jiangnan University, Henan Normal University, Southwest University, Xiamen University, Ningbo University, University of South China, and Heilongjiang University.
Features
fA‑level current testing capability with excellent shielding performance to reduce external electromagnetic interference;
Repeat function enables simultaneous measurement and display of curves under different conditions;
Supports simultaneous saving in two formats: image (bmp) and data (xls);
True 1/f noise measurement and analysis, revealing the dynamic impacts of defects on electric current;
Noise floor lower than 2×10⁻²⁹ A²/Hz (or 1×10⁻³¹ A²/Hz), enabling easy measurement of nA‑level (or pA‑level) current noise;
One‑click switch between DC and AC modes, which physically eliminates the influence of DC components on 1/f curves;
Visual dynamic averaging; three data‑processing methods including RMS, Vector and Peak, with up to 500 averaging times;
On‑site selection of time‑domain data, automatic fitting calculation and one‑click display of 3dB bandwidth;
On‑line bad‑point removal function for better defined curve patterns.
Application
Materials Science
Physics
Sensors
Photovoltaic Devices
Research of perovskite and other semiconductor materials
Testable Devices
Photodetectors, 2D novel functional material devices, sensors, etc.
Specification
Bias Voltage Range | ±10V |
Current Resolution | <10fA |
| Data Sampling Rate | 2M/S |
High-speed Current Gain | 103～1011 |
| Low-speed Current Gain | 105～1014 |
| System Current Baseline Noise | 2×10-29A2/Hz (Low Frequency) 1×10-31A2/Hz (Ultra-low Frequency) |
| Low-frequency Noise Range | 1Hz-100KHz |
| Ultra-low Frequency Noise Range | 0.01Hz-10Hz |
| Datasheet |  |
Measurement
 |  |
Changchun New Industries Optoelectronics Technology Co., Ltd.
Address: No. 888 Jinhu Road, High-Tech Zone, Changchun, 130103, P.R.China
International Tel:+86-431-85603799
Email: sales@cnilaser.com
Send a Message
Leave your phone number, and we'll get in touch with you as soon as possible.